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CVS Commit History:
2014-05-09 09:38:42 by Thomas Klausner | Files touched by this commit (229) |
Log message:
Mark packages that are not ready for python-3.3 also not ready for 3.4,
until proven otherwise.
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2014-01-25 11:38:08 by Thomas Klausner | Files touched by this commit (171) | |
Log message:
Mark packages as not ready for python-3.x where applicable;
either because they themselves are not ready or because a
dependency isn't. This is annotated by
PYTHON_VERSIONS_INCOMPATIBLE= 33 # not yet ported as of x.y.z
or
PYTHON_VERSIONS_INCOMPATIBLE= 33 # py-foo, py-bar
respectively, please use the same style for other packages,
and check during updates.
Use versioned_dependencies.mk where applicable.
Use REPLACE_PYTHON instead of handcoded alternatives, where applicable.
Reorder Makefile sections into standard order, where applicable.
Remove PYTHON_VERSIONS_INCLUDE_3X lines since that will be default
with the next commit.
Whitespace cleanups and other nits corrected, where necessary.
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2012-09-29 02:50:33 by Aleksej Saushev | Files touched by this commit (158) |
Log message:
Drop superfluous PKG_DESTDIR_SUPPORT, "user-destdir" is default these days.
Mark packages that don't or might probably not have staged installation.
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2012-04-08 21:09:41 by Thomas Klausner | Files touched by this commit (127) |
Log message:
Remove python24 and all traces of it from pkgsrc.
Remove devel/py-ctypes (only needed by and supporting python24).
Remove PYTHON_VERSIONS_ACCEPTED and PYTHON_VERSIONS_INCOMPATIBLE
lines that just mirror defaults now.
Miscellaneous cleanup while editing all these files.
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2011-09-20 02:00:37 by Kamel Derouiche | Files touched by this commit (4) | |
Log message:
Import gwyddion-2.20 as wip/gwyddion.
Gwyddion is a modular program for Scanning Probe Microscopy (SPM) data
visualization and analysis. It is primarily intended for analysis of height
field data obtained by microscopy techniques like Atomic Force Microscopy (AFM),
Magnetic Force Microscopy (MFM), Scanning Tunneling Microscopy (STM),
Near-field Scanning Optical Microscopy (SNOM or NSOM) and others. However,
it can be used for arbitrary height field and image analysis.
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